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1.
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Clear description of the referenced document:
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Name:
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JEDEC standard JESD89A
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Title:
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Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices.
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2.
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Status of approval:
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The referenced JEDEC standard JESD89A was approved in October 2006 and reaffirmed in January 2012.
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3.
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Justification for the specific reference:
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This standard is regarded as most reliable standard for soft error test method for semiconductor devices. Most semiconductor device manufacturers refer JESD89A as soft error test method and the data related to soft error of component used in telecommunication equipment are obtained by the test method specified in the standard.
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4.
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Current information, if any, about IPR issues:
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No known issues.
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5.
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Other useful information describing the "Quality" of the document:
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The referenced standard has completed the rigorous and comprehensive review in JEDEC with the effort of more than 70 members. It was approved and published in 2006.
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6.
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The degree of stability or maturity of the document:
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The first version of referenced standard has completed in 2001 as JESD89 and revised version JESD89A was published in 2006 and it was reaffirmed in 2012. The standard is very stable for more than ten years.
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7.
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Relationship with other existing or emerging documents:
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None.
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8.
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Any explicit references within that referenced document should also be listed:
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Followings are bibliographic references in the standard./
[1] N. Seifert, N. Tam, "Timing Vulnerability Factors of Sequentials", IEEE Transactions on Device and Materials Reliability, Vol. 4, Nr. 3, pp. 516-522, September 2004./
[2] N. Seifert, P. Shipley, M.D. Pant, V. Ambrose, and B.S. Gill, “Radiation-induced clock jitter and race“. IEEE International Reliability Physics Symposium, 2005, pp. 215-222./
[3] Karnik, T.; Hazucha, P, “Characterization of soft errors caused by single event upsets in CMOS processes”, Dependable and Secure Computing, IEEE Transactions on, Volume 1, Issue 2, April-June 2004 pp.128–143./
[4] Gadlage, M.J.; Schrimpf, R.D.; Benedetto, J.M.; Eaton, P.H.; Turflinger, T.L.; “Modeling and verification of single event transients in deep submicron technologies”, 42nd Annual IEEE International Reliability Physics Symposium Proceedings, April 2004, pp. 673–674./
[5] Balkaran S. Gill, Chris Papachristou, Francis G. Wolff, Norbert Seifert, “Node sensitivity Analysis for Soft Errors in CMOS Logic”, IEEE International Test Conference, Nov. 8, 2005, pp. 964-972./
[6] Xiaowei Zhu; Rob Baumann; Charles Pilch; Joe Zhou; Jason Jones; Claude Cirba; Piyush Patel, “Comparison of product failure rate to component soft error rate in a multi-core digital signal processor”, 43nd Annual IEEE International Reliability Physics Symposium Proceedings, April 2005, pp. 209-214./
[7] N. Tsoulfanidis, “Measurement and Detection of Radiation”, second edition, Taylor & Francis 1995, pp. 273/
[8] H.H.K. Tang, “Nuclear physics of cosmic ray interactions with semiconductor materials: Particleinduced soft errors from a physicist’s perspective”, IBM J. Res. Develop 40(1), pp. 91-108 (1996)./
[9] M. Drosg, “Sources of fast monoenergetic neutrons. More recent developments”, Proc. of the SPIE – The International Society for Optical Engineering, v. 2339, pp. 145-155 (1995)./
[10] T. Grandlund, B. Granbom, and N. Olsson, “A Comparative Study Between Two Neutron Facilities Regarding SEU,” IEEE Trans. Nucl. Sci., 51, p. 2922 (2004)/
[11] IEC 62396 TS Ed. 1 (June, 2005), "PROCESS MANAGEMENT FOR AVIONICS INDUSTRY - Standard for the Accommodation of Atmospheric Radiation Effects via Single Event Effects within Avionics Electronic Equipment", International Electrotechnical Commission./
[12] E.L.Petersen et al., “Rate Prediction for Single Event Effects”, IEEE Trans. Nucl. Sci., TNS-39, p.1577 (1992)./
[13] R. Fleischer, “Cosmic ray interactions with boron: a possible source of soft errors” IEEE Trans. Nucl. Sci., 30(5), p. 4013, Oct. 1983./
[14] T.R. Oldham, S. Murrill, and C.T. Self, “Single Event Upset of VLSI Memory Circuits Induced by Thermal Neutrons”, HEART Conf., 1986./
[15] R. C. Baumann and E. B. Smith, "Neutron-induced 10B fission as a major source of soft errors in high density SRAMs," Elsevier Microelec. Reliability, vol. 41, no. 2, p.211, 2001./
[16] IEC62396 TS “PROCESS MANAGEMENT FOR AVIONICS INDUSTRY – Standard for the/
accommodation of Atmospheric Radiation Effects via Single Event Effects within Avionics Electronic Equipment,” International Electrotechnical Commission, 2005. /
[17] M. S. Gordon, P. Goldhagen, K. P. Rodbell, T. H. Zabel, H. H. K. Tang, J. M. Clem, and P. Bailey, "Measurement of the Flux and Energy Spectrum of Cosmic-Ray Induced Neutrons on the Ground," IEEE Transactions on Nuclear Science, vol. 51, no. 6, pp. 3427-3434, Dec. 2004./
[18] LT J. D. Dirk, M. E. Nelson, J. F. Ziegler, A. Thompson and T. H. Zabel, “Terrestrial Thermal Neutrons”, IEEE Trans. Nucl. Sci., vol. 50, no. 6., pp. 2060-2064, Dec. 2003./
[19] M. E. Shea and D. F. Smart, "Tables of asymptotic directions and vertical cutoff rigidities for a five degree by fifteen degree world grid as calculated using the International Geomagnetic Reference Field for epoch 1975.0," Air Force Geophysics Laboratory, Report AFCRL-TR-75-0185, Hanscom AFB, Massachusetts, 1975. (AD-A012509)/
[20] J. Clem and L. Dorman, "Neutron monitor response functions," Space Sci. Rev., vol. 93, no. 1-2, pp.335-363, 2000, and references therein./
[21] A. Belov, A. Struminsky, and V. Yanke, "Neutron Monitor Response Functions for Galactic and Solar Cosmic Rays", 1999 ISSI Workshop on Cosmic Rays and Earth, poster presentation.
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9.
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Qualification of
JEDEC:
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SG5 at its meeting in 11-20 May 2020 qualified JEDEC for ITU-T A.5
SG5 Report (SG5-R8)
TD1318 (https://www.itu.int/md/meetingdoc.asp?lang=en&parent=T17-SG05-200511-TD-GEN-1318)
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10.
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Other (for any supplementary information):
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None.
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