Supplement 17 to ITU-T K-series Recommendations (05/2019) - ITU-T K.44 – Test conditions and methods information
Summary
History
FOREWORD
Table of Contents
1 Scope
2 Reference
3 Definitions
     3.1 Terms defined elsewhere
4 Abbreviations and acronyms
5 Conventions
6 Testing
     6.1 General
     6.2 Lightning surge tests
          6.2.1 Inherent test
          6.2.2 Secondary protector coordination test
          6.2.3 Primary protector coordination test
          6.2.4 Uc(max) test
          6.2.5 Effects for voltages greater than Uc(max)
     6.3 Power induction
          6.3.1 Inherent test
          6.3.2 Secondary protector coordination test
          6.3.3 Secondary protector operating test
          6.3.4 Minimum energy to operate positive temperature coefficient thermistors
          6.3.5 Primary protector coordination test
               6.3.5.1 Primary protector coordination test for equipment without positive temperature coefficient thermistors
               6.3.5.2 Primary protector coordination test for equipment with positive temperature coefficient thermistors
          6.3.6 Ua.c.(max) test
     6.4 Mains power contact
     6.5 Rationale for test conditions
          6.5.1 Port to port and port to earth testing
          6.5.2 Terminations and surge protective devices on untested ports
     6.6 Decoupling networks
          6.6.1 Decoupling inductance
          6.6.2 Effect of inductance and resistance decoupling elements on digital circuits
     6.7 Mains port testing
7 Range of lightning and power induction test levels
     7.1 Lightning
          7.1.1 Inherent test levels
          7.1.2 Coordination test levels
     7.2 Power induction test levels
          7.2.1 Inherent test levels
          7.2.2 Inherent/coordination test levels
8 Relationship between [ITU-T K.44] and other product or product family Recommendations
Bibliography