1
Scope
2
References
3
Definitions
3.1
Terms defined elsewhere
4
Abbreviations and acronyms
5
Functional block diagram
6
Interfaces
6.1
Optical interfaces
6.2
Electrical interfaces
6.3
External reference clock input
6.4
Input interface sensitivity
7
Jitter generation function
7.1
Modulation source
7.2
Clock generator
7.3
Digital test pattern generator
7.4
Minimum jitter generation capability
7.5
Generation accuracy
8
Jitter measurement function
8.1
Reference timing signal
8.2
Measurement capabilities
8.3
Measurement bandwidths
8.4
Measurement accuracy
8.5
Analogue output
8.6
Jitter transfer measurement accuracy
9
Operating environment
Annex A – OTUk test signals for jitter measurement
A.1
Introduction
A.2
Test signal structure for OTN signals