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  Home : ITU-T : SG 16 : Temporary Documents (Meeting 2011-11-21) : 212-WP3 Recently posted -  Search Meeting Documents
   
[212-WP3]  G.729-VAD-Layer: Characterization phase processing test plan

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152064 bytes 2011-08-04 [212-WP3] 
 

Document :

ITU-T SG 16  (Study Period 2009)  Temporary Document  212-WP3

Title :

G.729-VAD-Layer: Characterization phase processing test plan

Date :

2011-08-04

Source :

Rapporteur Q10/16

AI/Question :

Q10/16

Access :

Restricted to TIES users [ITU-T]

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Updated : 2011-08-04