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[674]  Outline of K.gm: Test Methods and preferred values for hybrid integrated circuit components containing gas discharge tube and metal oxide varistor technologies

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Document :

ITU-T SG 5  (Study Period 2017)  Contribution  674

Title :

Outline of K.gm: Test Methods and preferred values for hybrid integrated circuit components containing gas discharge tube and metal oxide varistor technologies

Date :

2020-04-28

Source :

Bourns Limited (United Kingdom)

AI/Question :

Q2/5

Meeting :

2020-05-11

Access :

Restricted to TIES users [ITU-T]
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Updated : 2020-04-29