Document :

ITU-T SG 15  (Study Period 2017)  Contribution  1389

Title :

Note on measuring cTE under variable temperature [G.8273.2, G.8273.4]

Date :

2019-06-18

Source :

Microsemi Corporation (United States)

AI/Question :

Q13/15

Meeting :

2019-07-01

Access :

Restricted to TIES users [ITU-T]